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STM32WLE_PlatformIO
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Name
Complexity
Churn
Issues
A
test\test_target_1\test.cpp
4 1 -
A
test\test_mixed_logging\test.cpp
7 1 -
A
test\test_generic_sensors\test.cpp
17 1 -
A
test\test_generic_sensor_battery\test.cpp
5 2 -
A
test\test_generic_nvsmap\test.cpp
6 1 -
A
test\test_generic_nvs\test.cpp
9 1 -
A
test\test_generic_linearbuffer\test.cpp
16 1 -
A
test\test_generic_hexascii\test.cpp
9 1 -
A
test\test_generic_graphics\test.cpp
23 1 -
A
test\test_generic_font\test.cpp
6 1 -
A
test\test_generic_display\test.cpp
22 4 -
A
test\test_generic_circularbuffer\test.cpp
8 1 -
A
test\test_generic_bitmap\test.cpp
13 1 -
A
test\test_generic_aeskey\test.cpp
5 1 -
A
test\test_generic_aesblock\test.cpp
5 1 -
A
src\main.cpp
2 2 -
A
lib\sensors\tsl2591.h
0 1 -
A
lib\sensors\tsl2591.cpp
21 1 -
A
lib\sensors\sensorcollection.h
0 2 -
A
lib\sensors\sensorcollection.cpp
21 2 -