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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\evcem\usecase_test.go
1 3 -
A
usecases\cem\evsoc\usecase_test.go
1 3 -
A
mocks\DeviceDiagnosisServerInterface.go
12 3 -
A
mocks\ElectricalConnectionClientInterface.go
42 3 -
A
features\client\timeseries_test.go
7 3 -
A
mocks\ElectricalConnectionCommonInterface.go
91 3 -
A
usecases\cem\evsecc\usecase.go
3 3 -
A
usecases\cem\evsecc\usecase_test.go
1 3 -
A
mocks\FeatureInterface.go
48 3 -
A
api\usecases.go
 3 -
A
usecases\cem\evsecc\types.go
 3 -
A
features\client\deviceclassification_test.go
4 3 -
A
features\internal\devicediagnosis_test.go
4 3 -
A
mocks\LoadControlServerInterface.go
24 3 -
A
usecases\cs\lpc\types.go
 3 -
A
features\client\deviceconfiguration.go
10 3 -
A
mocks\MeasurementClientInterface.go
32 3 -
A
usecases\cem\vapd\usecase.go
3 3 -
A
mocks\MeasurementServerInterface.go
24 3 -
A
usecases\cem\vapd\usecase_test.go
1 3 -