dev
eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\mocks\EgLPCInterface.go
135 5 -
A
usecases\usecase\testhelper_test.go
8 5 -
A
features\server\devicediagnosis_test.go
4 5 -
A
features\server\electricalconnection_test.go
7 5 -
A
features\client\loadcontrol_test.go
8 5 -
A
usecases\mocks\CsLPPInterface.go
148 5 -
A
usecases\mocks\CsLPCInterface.go
148 5 -
A
usecases\ma\mgcp\events.go
48 5 -
A
usecases\eg\lpp\usecase.go
4 5 -
A
usecases\eg\lpc\types.go
 5 -
A
features\server\measurement_test.go
5 5 -
A
features\internal\electricalconnection_test.go
34 5 -
A
usecases\eg\lpc\usecase.go
3 5 -
A
mocks\ServiceReaderInterface.go
27 5 -
A
features\server\loadcontrol_test.go
6 5 -
A
usecases\cs\lpp\types.go
 5 -
A
usecases\cem\evcc\events_test.go
7 4 -
A
usecases\cem\cevc\usecase.go
3 4 -
A
features\client\feature_test.go
8 4 -
A
usecases\cs\lpp\events_test.go
9 4 -