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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\internal\helper.go
16 3 -
A
usecases\eg\lpp\usecase_test.go
1 3 -
A
api\usecases.go
 3 -
A
features\client\deviceclassification_test.go
4 3 -
A
features\internal\devicediagnosis_test.go
4 3 -
A
usecases\cem\oscev\events.go
19 3 -
A
mocks\LoadControlServerInterface.go
24 3 -
A
usecases\eg\lpc\usecase_test.go
1 3 -
A
usecases\cem\oscev\types.go
 3 -
A
features\client\deviceconfiguration.go
10 3 -
A
mocks\MeasurementClientInterface.go
32 3 -
A
mocks\MeasurementServerInterface.go
24 3 -
A
usecases\cs\lpp\usecase_test.go
3 3 -
A
.mockery.yaml
 3 -
A
usecases\cem\opev\usecase.go
3 3 -
A
mocks\TimeSeriesClientInterface.go
42 3 -
A
usecases\usecase\events.go
34 3 -
A
features\client\devicediagnosis_test.go
5 3 -
A
mocks\UseCaseBaseInterface.go
47 3 -
A
mocks\UseCaseInterface.go
52 3 -