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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\evcc\usecase.go
3 3 -
A
usecases\cem\vapd\public_test.go
3 3 -
A
usecases\cem\vabd\usecase_test.go
1 3 -
A
usecases\cem\evsecc\types.go
 3 -
A
features\client\deviceconfiguration.go
10 3 -
A
mocks\MeasurementClientInterface.go
32 3 -
A
usecases\cem\evsecc\public_test.go
2 3 -
A
mocks\MeasurementServerInterface.go
24 3 -
A
usecases\cem\oscev\types.go
 3 -
A
mocks\TimeSeriesClientInterface.go
42 3 -
A
usecases\cem\evcem\usecase.go
3 3 -
A
usecases\cs\lpc\types.go
 3 -
A
mocks\UseCaseBaseInterface.go
47 3 -
A
features\client\devicediagnosis_test.go
5 3 -
A
mocks\UseCaseInterface.go
52 3 -
A
usecases\mocks\CemVABDInterface.go
88 3 -
A
usecases\mocks\CemEVSOCInterface.go
61 3 -
A
usecases\cem\vapd\types.go
 3 -
A
usecases\cem\vabd\types.go
 3 -
A
usecases\cem\evsecc\usecase.go
3 3 -